| Model: | MX63 |
|---|---|
| Function: | Optical inspection of wafer surfaces. |
| Engineer: | Teacher Wang / +86-21-34206126-6005 / fdwang@1 |
| Location: | East Area – Lithography IIIA |
| Equipment ID: | ELT3WMM01 |
The system is designed for optical inspection and characterization of wafer surfaces.
Technical Specifications