X-ray diffraction(XRD) is used for phase identification, crystal structure analysis, residual stress measurement, crystallinity evaluation, texture characterization, and nanomaterial research. It is widely applied in materials science, chemistry, geology, and related fields.

Process/Testing Capabilities

XRD is a multifunctional, high-precision X-ray diffraction analysis system integrated with advanced capabilities such as micro-area analysis and 2D detection. The system is equipped with a high-resolution goniometer, a micro-focus X-ray optical system, and a high-speed two-dimensional detector, enabling micro-area diffraction, high-resolution XRD (HRXRD), and grazing-incidence thin film analysis.

Its key advantage lies in the ability to perform crystallographic analysis on microscopic regions of a sample (e.g., individual grains or defects), providing comprehensive crystallographic solutions for research in semiconductors, new energy materials, nanomaterials, and geological samples.

Technical Specifications

1. X-ray tube type: Cu target ceramic X-ray tube, with a tube power ≥ 2.2 kW and a lifetime ≥ 4000 hours.
2. All optical accessories are designed in a modular format, enabling tool-free installation and removal.
3. The direct beam intensity before the absorption filter is ≥ 3 × 10⁷ cps.
4. The diffraction beam path is a three-path system automatically switched by software: (1) variable divergence slit for diffraction path; (2) analyzing crystal optical module; (3) automatic beam attenuator (absorption filter).
5. Vertical θ/θ goniometer configuration with horizontal sample mounting.
6. X-axis translation stage with a travel range of ±40 mm, motor-driven.
7. Y-axis translation stage with a travel range of ±40 mm, motor-driven.