| Model: | DSE200s |
|---|---|
| Function: | 1.Deep silicon etching using Bosch or non-Bosch processes 2.TSV (Through-Silicon Via) deep silicon etching 3.Surface silicon structure etching for SOI wafers |
| Engineer: | Mr. Liu / +86-21- 34206126-6013 / minliu@1 |
| Location: | West Area, Thin Film II Zone |
| Equipment ID: | WF2NDSE02 |
This system is primarily used for deep silicon etching and supports both Bosch and non-Bosch processes, enabling broad process coverage.
It is equipped with advanced fast-response hardware and optimized software control specifically designed for Bosch cyclic processing. Combined with advanced process technologies, the system delivers excellent performance for high-aspect-ratio etching, meeting a wide range of process requirements.
Process / Testing Capabilities
Maximum etch rate: ~6 μm/min. Selectivity to photoresist: up to 50:1. Aspect ratio: >30:1. Sidewall roughness: <50 nm.
Technical Specifications
Designed for 6-inch wafers; compatible with 4-inch, 3-inch wafers and irregular samples. Supports diced samples (with carrier wafer mounting). Applicable to glass substrates such as SOG (Spin-On Glass)
This method, originally proposed by Robert Bosch, enables deep silicon etching with high aspect ratios and well-defined vertical structures.


可接受的掩膜材料为光刻胶,二氧化硅、氮化硅等硬掩模,不接受金属掩膜。