| Model: | LH2 |
|---|---|
| Function: | 1.High-quality polysilicon deposition at approximately 630°C (process gas: silane). 2.High-quality amorphous silicon deposition at approximately 540°C. |
| Engineer: | Li / +86-21- 34206126-6015 / lijinxi@1 |
| Location: | West Area, High-Temperature Furnace Zone |
| Equipment ID: | WDFSLPF01 |
This system is used for depositing polysilicon or amorphous silicon thin films via Low-Pressure Chemical Vapor Deposition (LPCVD). The deposited films exhibit high quality and are critical in micro/nano fabrication, especially in silicon-based CMOS processes.
Process / Testing Capabilities
Deposition of polysilicon and amorphous silicon thin films using LPCVD. Typical process temperature: around 600°C. Film thickness range: approximately 30 nm to 400 nm. Film uniformity: within 3%
Technical Specifications
Suitable for wafers up to 6 inches. LPCVD-based thin film deposition for both polysilicon and amorphous silicon


600度左右。