Oxidation Furnace (Dry / Wet Oxidation)
Horizontal Oxidation / Diffusion Furnace
Operating
Model: AH3
Function: 1.High-quality dry oxidation of silicon dioxide (SiO₂). 2.Wet oxidation for ultra-thick silicon dioxide films. 3.Thermal annealing processes below 1100°C.
Engineer: Li / +86-21- 34206126-6015 / lijinxi@1
Location: West Area, High-Temperature Furnace Zone
Equipment ID: WDFSOXD03
  • Basic Equipment Information
  • Operating Principle
  • Typical Application Case
 

Main Applications

  1. High-quality dry oxidation of silicon dioxide (SiO₂), typically for films below 300 nm.
  2. 2.Wet oxidation for thick silicon dioxide films, ranging from 300 nm to 3 μm.
  3. Thermal annealing processes below 1100°C.

 

Process / Testing Capabilities

  • Dry oxidation for high-quality SiO₂ films (below 300 nm)
  • Wet oxidation for thick SiO₂ films (300 nm to 3 μm)
  • Thermal annealing processes below 1100°C

 

Technical Specifications

  • Compatible with wafers up to 6 inches (and smaller sizes)
  • Temperature range: 300°C to 1100°C
  • Heating rate: 10°C/min
  • Dry oxidation using oxygen (O₂) process
  • Wet oxidation using a steam generator (steamer)

Dry oxidation is achieved by introducing oxygen (O₂) into the chamber, while wet oxidation is carried out using steam generated by a steam generator. The quartz chamber is rapidly heated بواسطة the heater system, and nitrogen (N₂) can be used as an inert gas to enable high-temperature annealing processes.

 

Thermal oxidation of silicon substrates. Thermal annealing and other heat treatment processes

 

Only 3”–6” silicon wafers (round wafers) are allowed. Post-processed wafers are strictly prohibited
The list below shows FAQs (click a question to view the answer). If your question is not listed, you can leave a message using the link.
FAQs
  • 01
    此设备可以用于后道样品吗?

    严禁污染,禁止后道工艺样品进入。

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