| Model: | RTP-600 |
|---|---|
| Function: | Heating temperature range: RT to 1100 °C; ramp rate: 10 °C/s; cooling methods: water cooling and gas cooling, average cooling rate ~30 °C/min Process gases: PN₂ and Ar (applicable to conventional annealing, metal silicidation, and alloying processes) Substrate compatibility: 6-inch wafers and smaller samples |
| Engineer: | Li / +86-21- 34206126-6015 / lijinxi@1 |
| Location: | West Area,High-Temperature Furnace Zone |
| Equipment ID: | WDFJRTP01 |
This system is designed for rapid thermal annealing (RTA) of samples, with a temperature range of 300–1100 °C. It can be used for post-ion implantation activation, as well as thermal annealing and defect repair processes for various materials.
An inert gas atmosphere is employed to effectively prevent sample oxidation during processing.
Process/Testing Capabilities
Capable of rapid thermal annealing for 6-inch wafers and smaller samples. The process temperature range is 300–1100 °C, with programmable temperature profiles and user-defined temperature zones.The system is equipped with two inert process gas lines, N₂ and Ar.
Technical Specifications
The system features two temperature control modes: thermocouple-based control for low-temperature operation (< 800 °C) and infrared pyrometer control for high-temperature operation (≥ 800 °C).Ramp rate: 10 °C/s.Temperature control accuracy: ≤ 1%

不可以,1000度以上工艺原则不超过1分钟