Zeiss Ultra Plus场发射扫描电子显微镜 (Zeiss Ultra Plus Field Emission Scanning Electron Microscope) 主要技术指标/Specifications: 分辨率:≤0.8nm@15V,≤1.6nm@1kV Resolution: ≤0.8nm@15V,≤1.6nm@1kV 加速电压:0.02kV-30kV,优异的低电压性能适合观察导电性较差的样品; Acceleration Voltage: 0.02kV-30kV, the excellent low-KV image favors the observation of sample that conducts electricity poorly. 探测器: 极靴内高效二次电子探测器及能量选择背散射电子探测器,样品室内高效二次电子探测器及角度选择背散射电子探测器,能同时获得二次电子图像和背散射电子像。 Detectors: In-lens EsB detector with filtering gird (0-1500V), high efficiency in-lens SE detector, chamber mounted Everhart-Thornley detector, integrated ASB detector 样品台:最大样品尺寸Φ200mm,5轴电动优中心样品台,可倾斜范围为-3~70°,连续旋转360°。…